Benchtop XRF Spectrometers

Benchtop XRF Spectrometers

Benchtop XRF spectrometers measure coating thickness and determine material composition non-destructively – from electroplated coatings to gold and silver alloys. The Helmut Fischer FISCHERSCOPE X-RAY XAN is a universal analyzer for metals and alloys. XUL / XULM are entry-level coating thickness instruments, XDL / XDLM are for series testing of electroplated coatings. XDAL and XDV are designed for very thin and multi-layer coatings. The right model depends on the size of the parts, the coating thickness and the required accuracy.

Helmut Fischer FISCHERSCOPE X-RAY XAN – universal metal and alloy analyzer

For trade, industry and laboratories: determining the composition of gold and silver alloys, analysing dental alloys, measuring coating thickness on simply shaped samples, screening for hazardous substances (e.g. lead in toys) according to RoHS.

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Helmut Fischer FISCHERSCOPE X-RAY XULM / XUL – entry-level coating thickness gauge

For electroplating companies and electronics manufacturing that need fast and accurate measurement of coating thickness on small parts and of metal content in electroplating baths.

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Helmut Fischer FISCHERSCOPE X-RAY XDL / XDLM – serial inspection of electroplated coatings

For the electroplating, aviation and sanitary fittings industries – for quality control of mass-produced parts, incoming goods inspection and production monitoring.

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Helmut Fischer FISCHERSCOPE XDAL – new-generation thin coating analyzer

For electronics and semiconductor manufacturing (lead frames, connectors, PCBs), for inspecting multilayer systems and functional coatings ≤ 0.1 µm, and for determining the lead content in solders and the phosphorus content in NiP coatings.

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Helmut Fischer FISCHERSCOPE XDV – top-of-the-range universal XRF instrument

For laboratories and production where extremely thin and complex coatings are measured (Au/Pd ≤ 50 nm, gold from 2 nm on lead frames, coatings on silicon wafers), light elements (Al, Ti, NiP) and fuel cell and battery foils (Pt, Ir, Ce; Ni, Co, Mn) are analysed, and gold analysis to the highest requirements is carried out.

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