XRF Analyzers for Metals and Gold

Metal and Gold Analysis (XRF)

X-ray fluorescence analysis (XRF) is a non-destructive method for determining the elemental composition of a material and the thickness of coatings. When a sample is irradiated with X-rays, each element emits fluorescence with a characteristic energy; the detector records it and the software calculates the alloy composition (e.g. gold fineness) or the coating thickness. The measurement does not touch or damage the sample, needs no chemical preparation and takes from a few seconds to a few minutes.
Helmut Fischer XRF instruments are designed for jewellers, pawnshops, precious metal traders and refiners, electroplating companies (coating thickness, metal concentration in baths), electronics and printed circuit board (PCB) manufacturing, the semiconductor industry, testing laboratories and RoHS screening.
How to choose:

Detector. Proportional counter (PC) – fast, more affordable, suitable for thicker electroplated coatings; Si-PIN – entry level for alloy analysis; silicon drift detector (SDD, 20 or 50 mm²) – high resolution, the thinnest coatings, trace analysis, RoHS.
Benchtop or handheld. Benchtop instruments are fully protected, type-approved devices for the laboratory and production; the handheld XAN 500 is for large parts and field conditions.
Measuring chamber size: sample height from 90 to 170 mm, PCB stages up to 610 × 610 mm, modular chambers up to 1.5 m³.
Measuring direction: bottom-up (fast positioning) or top-down (automated series, programmable XY stage).
Software: WinFTM or the new FISIQ X (XDAL / XDV generation).

In your enquiry please state: the materials and coating systems to be measured (e.g. Au/Ni/Cu), the expected thickness range, sample dimensions and shape, the smallest structure to be measured, the required throughput (pcs/h), and whether you need automation, RoHS or alloy analysis.

Automated XRF Systems

Automated XRF systems measure coating thickness and composition directly in the production process rather than in the laboratory. The Helmut Fischer FISCHERSCOPE X-RAY 4000 is designed for reel-to-reel electroplating, electrical contacts and lead frames. The X-RAY 5000 suits thin-film control in photovoltaics, fuel cell, glass and foil production. The XAN Liquid Analyzer continuously analyses the composition of plating baths and can replace manual titration. Such systems help detect deviations early and reduce scrap.

Benchtop XRF Spectrometers

Benchtop XRF spectrometers measure coating thickness and determine material composition non-destructively – from electroplated coatings to gold and silver alloys. The Helmut Fischer FISCHERSCOPE X-RAY XAN is a universal analyzer for metals and alloys. XUL / XULM are entry-level coating thickness instruments, XDL / XDLM are for series testing of electroplated coatings. XDAL and XDV are designed for very thin and multi-layer coatings. The right model depends on the size of the parts, the coating thickness and the required accuracy.

Handheld XRF Analyzers

A handheld XRF analyzer is needed when a part is too large for a benchtop instrument or when measurements have to be taken outside the laboratory. The Helmut Fischer FISCHERSCOPE X-RAY XAN 500 is a portable analyzer for quality control, incoming goods inspection and production monitoring. It can be used on large parts such as pipes, housings and machine components.

XRF for Microstructures and PCBs

In electronics and semiconductor manufacturing, coatings are measured on very small areas: tracks, contacts, SMD components, lead frames. Helmut Fischer FISCHERSCOPE XDV-µ instruments with polycapillary optics focus the X-ray beam onto a very small spot. The XDV-µ PCB XL is designed for large printed circuit boards (ENIG, ENEPIG, immersion Ag and Sn), and the XDV-µ SEMI for automated inspection of semiconductor wafers.

XRF Gold Analyzers

XRF gold analyzers determine the content of gold, silver and other precious metals in an alloy within a few tens of seconds, without damaging the item. The Helmut Fischer GOLDSCOPE SD is designed for jewellery workshops, pawnshops, gold buyers, assay laboratories and dental alloy manufacturers. The GOLDSCOPE SD 600 is the most powerful model, for higher accuracy and larger items.

XRF Software and Standards

Helmut Fischer FISIQ X is the new-generation software for FISCHERSCOPE XDAL and XDV instruments. It is designed for coating thickness measurement and material analysis, simplifies the workflow and helps you get results faster. Standards for calibrating XRF instruments can be found in the "Probes, Standards and Accessories" section.