Helmut Fischer FISCHERSCOPE XDAL – new-generation thin coating analyzer
Applications
For electronics and semiconductor manufacturing (lead frames, connectors, PCBs), for inspecting multilayer systems and functional coatings ≤ 0.1 µm, and for determining the lead content in solders and the phosphorus content in NiP coatings. The manufacturer presents it as the successor to the FISCHERSCOPE X-RAY XDAL.
Key features
- FISIQ X software with AI-assisted spectrum mode
- High-speed Z axis – 6 times faster positioning, autofocus < 2 s (14 times faster than the X-RAY XDAL 237)
- Overview camera with 10 times higher resolution, multi-zone LED illumination
- Motorised hood (automatic or manual mode), programmable measuring stage
- 180° status indicator; individually approved fully protected instrument
- Optimised arrangement of tube, sample and detector – higher intensity
Models
XDAL 620 (SDD 20 mm²); XDAL 650 (SDD 50 mm²). Previous generation: X-RAY XDAL 237 (Si-PIN or SDD 20/50 mm², spot approx. Ø 0.15 mm, 4 apertures, 3 filters, up to 140 mm, WinFTM); X-RAY XDAL 600 (SDD 20 mm², manual scissor stage, DPP+)
Technical data
- X-ray tube: microfocus, tungsten anode (other anodes on request)
- Detector: SDD 20 mm² or 50 mm²
- Apertures / filters: 4 interchangeable / 6 interchangeable
- Sample height: up to 140 mm
- Measuring direction: from above, stepless distance
- Coating thickness: < 0.05 µm; analysis at ppm level
- Software: FISIQ X
What we offer
- Selection of the instrument and configuration for your task, together with the manufacturer
- Trial measurements of your samples in the manufacturer’s laboratory
- Training, calibration and service organised through the manufacturer
Technical data according to the manufacturer: helmut-fischer.com, helmut-fischer.com
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