Helmut Fischer FISCHERSCOPE XDV – top-of-the-range universal XRF instrument
Applications
For laboratories and production where extremely thin and complex coatings are measured (Au/Pd ≤ 50 nm, gold from 2 nm on lead frames, coatings on silicon wafers), light elements (Al, Ti, NiP) and fuel cell and battery foils (Pt, Ir, Ce; Ni, Co, Mn) are analysed, and gold analysis to the highest requirements is carried out. The previous generation, XDV-SDD, is a universal instrument for tasks from thin layers to RoHS screening according to RoHS, WEEE, CPSIA.
Key features
- High-speed Z axis (6 times faster than the XDV-SDD), autofocus < 2 s
- Camera with 10 times higher resolution, multi-zone LED illumination for matt and glossy surfaces
- FISIQ X software with AI spectrum mode
- Motorised hood, programmable measuring stage
- Individually approved fully protected instrument
- XDV-SDD: DPP+ up to 50 % higher performance, aperture up to 3 mm, spot approx. Ø 0.25 mm
Models
XDV (new generation, FISIQ X); X-RAY XDV-SDD (previous generation, WinFTM)
Technical data
- X-ray tube: microfocus, tungsten anode (other anodes on request)
- Detector: SDD 50 mm²
- Apertures / filters: 4 interchangeable / 6 interchangeable
- Sample height: up to 140 mm
- Measuring direction: from above, stepless distance
- Autofocus: < 2 s
- XDV-SDD measuring spot: approx. Ø 0.25 mm
- Software: FISIQ X (XDV) / WinFTM (XDV-SDD)
What we offer
- Selection of the instrument and configuration for your task, together with the manufacturer
- Trial measurements of your samples in the manufacturer’s laboratory
- Training, calibration and service organised through the manufacturer
Technical data according to the manufacturer: helmut-fischer.com, helmut-fischer.com
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