Helmut Fischer FISCHERSCOPE X-RAY XAN – universal metal and alloy analyzer
Applications
For trade, industry and laboratories: determining the composition of gold and silver alloys, analysing dental alloys, measuring coating thickness on simply shaped samples, screening for hazardous substances (e.g. lead in toys) according to RoHS. The detector, measuring stage and version are selected to suit the task.
Key features
- Long measuring distance – samples up to 17 cm high, including parts with complex geometry
- DPP+ processor shortens measuring time for the same standard deviation (except XAN 215)
- Video microscope for precise selection of the measuring spot; optional manual XY stage
- Si-PIN or SDD detector; RoHS version with 50 mm² SDD
- Helium flushing (XAN 250/252) for measuring the light elements Mg, Al, Si
- WinFTM software in 15 languages
Models
XAN 215 (entry level, gold and silver alloys, without DPP+); XAN 220 / 250 (for gold trading with increasing requirements); XAN 250 / 252 (hazardous substance analysis for refining and laboratories)
Technical data
- X-ray tube: microfocus, tungsten anode
- Detector: Si-PIN or SDD (RoHS version – 50 mm² SDD)
- Sample height: 90–170 mm (depending on model)
- Smallest measuring spot: approx. Ø 0.3 mm
- Apertures: fixed or 4 interchangeable
- Primary filters: fixed or 6 interchangeable
- Functional layers: from 10 nm (electronics, semiconductors)
- Software: WinFTM
What we offer
- Selection of the instrument and configuration for your task, together with the manufacturer
- Trial measurements of your samples in the manufacturer’s laboratory
- Training, calibration and service organised through the manufacturer
Technical data according to the manufacturer: helmut-fischer.com
You might also be interested in
Helmut Fischer FISCHERSCOPE XDAL – new-generation thin coating analyzer
For electronics and semiconductor manufacturing (lead frames, connectors, PCBs), for inspecting multilayer systems and functional coatings ≤ 0.1 µm, and for determining the lead content in solders and the phosphorus content in NiP coatings.
Helmut Fischer FISCHERSCOPE XDV – top-of-the-range universal XRF instrument
For laboratories and production where extremely thin and complex coatings are measured (Au/Pd ≤ 50 nm, gold from 2 nm on lead frames, coatings on silicon wafers), light elements (Al, Ti, NiP) and fuel cell and battery foils (Pt, Ir, Ce; Ni, Co, Mn) are analysed, and gold analysis to the highest requirements is carried out.
Helmut Fischer FISCHERSCOPE X-RAY XULM / XUL – entry-level coating thickness gauge
For electroplating companies and electronics manufacturing that need fast and accurate measurement of coating thickness on small parts and of metal content in electroplating baths.
Helmut Fischer FISCHERSCOPE X-RAY XDL / XDLM – serial inspection of electroplated coatings
For the electroplating, aviation and sanitary fittings industries – for quality control of mass-produced parts, incoming goods inspection and production monitoring.