New: FISCHERSCOPE® XDV®-µ PCB XL – XRF coating inspection for large printed circuit boards
Helmut Fischer has launched the new FISCHERSCOPE® XDV®-µ PCB XL – a benchtop XRF instrument for measuring coating thickness and fine structures on large-format printed circuit boards (PCBs). It is designed for boards that standard systems can no longer accommodate: a measuring area of 610 × 610 mm, the largest in its class.
Who it is for
PCB manufacturers and electronics manufacturing service (EMS) companies that inspect the thinnest final finishes – ENIG, ENEPIG, immersion silver or tin – and the finest structures on large boards. The instrument operates in manual, semi-automatic or fully automatic mode and can be used stand-alone or integrated into an automated production line.
Large board – one placement
The XDV®-µ PCB XL is a larger version of the proven FISCHERSCOPE® X-RAY XDV®-µ PCB. Thanks to the 610 × 610 mm (24 × 24 in) measuring area, the whole board only needs to be placed once – there is no need to reposition it between measurements. An optional vacuum holder reliably holds even the thinnest and flexible boards in place.
Faster and more convenient work
- Stage extension by foot switch – both hands stay free, so loading and unloading large boards is safer and faster.
- Automatic pattern recognition – the instrument finds the correct measuring position itself, speeds up measuring programs and reduces operator intervention.
- Robust design – industrial components and a proven, durable frame ensure stability and long-term repeatability of results.
- IPC compliance – measurements comply with IPC 4552 and 4556 (ENIG, ENEPIG), 4553A (silver) and 4554 (tin).
Technical features
| Parameter | FISCHERSCOPE® XDV®-µ PCB XL |
|---|---|
| Measuring stage | high-precision, programmable, for boards up to 610 × 610 mm; optional vacuum holder |
| X-ray tube | “Ultra” microfocus, tungsten anode; optional molybdenum |
| Optics | polycapillary, manufactured by Fischer; measuring spot approx. Ø 10 µm or 17 µm (FWHM) |
| Detector | silicon drift (SDD), 20 mm² or 50 mm²; DPP+ – high precision even with short measurements |
| Filters | 4 interchangeable |
| Sample height | up to 10 mm |
| Applications | very thin coatings, e.g. gold / palladium layers ≤ 3 nm or 10 nm; automated quality control |
Test it with your own boards
If you are not sure whether the instrument will suit your boards and coatings, we can arrange for your samples to be measured in the Helmut Fischer laboratory. Together with the manufacturer we will select the right configuration – optics, detector and accessories. More about the instrument on the FISCHERSCOPE XDV-µ PCB XL page.
Technical data according to the manufacturer: helmut-fischer.com