QATM Qness 10 / 60 A+ – automatic microhardness tester with sample camera

Applications

For laboratories that need automatic hardness test series and multi-sample testing without an operator, but do not need the top positioning accuracy of the EVO class. Suitable for CHD/NHD/SHD, welds and metallographic analysis.

Key features

  • Fully automated test and analysis cycles without an operator, automatic focal plane detection
  • Motorised XY stage 150 × 150 mm, positioning accuracy ±2 µm
  • Sample overview camera 52 × 39 mm (A+), 8-position sample holder as standard
  • CAS collision avoidance system, “Optimum Stop” mode
  • Modular Brinell, Knoop, Rockwell test modules (can be added later)
  • Reduced noise level (“silenced design”)

Models

Qness 10 A+ (20 gf – 10 kgf); Qness 60 A+ (0.25 gf – 62.5 kgf)

Technical data

  • Test force: 10 A+ 20 gf – 10 kgf (0.196 – 98.07 N); 60 A+ 0.25 gf – 62.5 kgf (0.00245 – 612.92 N)
  • Methods: Vickers, Knoop, Brinell; Rockwell – option
  • Table: 150 × 120 mm (option 300 × 120 mm); travel X 150 / Y 150 mm (option 300 × 150); Z 150 mm (option 260 mm)
  • Objectives: XLED 2x – 100x; 5x, 20x, 50x included; 5 Mpix CMOS USB 3.0 camera
  • Throat depth 170 mm; max. sample weight 50 kg; instrument weight 60 kg
  • Software: Qpix Control2, Qpix INSPECT; Qconnect export to PDF, XML, CSV, Excel, Q-DAS, OPC UA, LIMS

Standards

DIN EN ISO 6506 / ASTM E-10; DIN EN ISO 6507 / ASTM E-92 / E-384; DIN EN ISO 4545; DIN EN ISO 6508 / ASTM E-18; DIN EN ISO 18265, ASTM E-140; optics according to DIN EN ISO 6507-1/2:2018

What we offer

  • Selection of the instrument and configuration for your task, together with the manufacturer
  • Trial measurements of your samples in the manufacturer’s laboratory
  • Training, calibration and service organised through the manufacturer

Request a quote

Technical data according to the manufacturer: qatm.com, qatm.com

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For laboratories and quality departments that need autonomous, unattended hardness traverses (CHD/NHD/SHD), weld and sintered part patterns, and metallographic microscopy in the same instrument.