Helmut Fischer FISIQ X – XRF software with AI

Applications

For users of the new-generation FISCHERSCOPE XDAL and XDV instruments. The software is designed for coating thickness measurement and material analysis; it simplifies the workflow and increases throughput.

Key features

• AI-assisted spectrum mode for analysing and comparing spectra; fast composition analysis of unknown materials
• Four guided workflows: calibration, measurement, analysis, reports
• Traceability through calibration standards with DAkkS certificate and a standards library
• Up to 6 times faster coating thickness calculation and up to 13 times faster material analysis than WinFTM 6
• Improved algorithm engine – stability and repeatability

Technical data

• Supported instruments: FISCHERSCOPE XDAL, FISCHERSCOPE XDV
• Calculation speed: up to 6× (coatings) / up to 13× (material analysis) compared with WinFTM 6

Standards

calibration standards with DAkkS certificate

What we offer

• Selection of the instrument and configuration for your task, together with the manufacturer
• Trial measurements of your samples in the manufacturer’s laboratory
• Training, calibration and service organised through the manufacturer

Request a quote

Technical data according to the manufacturer: helmut-fischer.com