High caliber FISCHERSCOPE® X-RAY XDV®-SDD

Helmut Fischer presents one of the most powerful X-ray fluorescence instruments in the Fischer portfolio.

XRF spectrometer FISCHERSCOPE® X-RAY XDV®-SDD is equipped with a high-resolution and powerful silicon drift detector (SDD) with an effective area of 50 mm². This allows you to measure even the thinnest layers precisely and non-destructively

In combination with the new in-house developed digital pulse processor DPP+, you can boost your measurements performance to a new level. Even higher count rates can now be processed, resulting in shorter measuring times

XDV-SDD is perfectly suited for non-destructive material analysis. XDV-SDD has changeable collimators and primary filters, which allows working on a scientific level. The extremely robust device with its intuitive control panel is easy to operate via a joystick and buttons, and is designed specifically for series tests in industrial use.

More about the device: XRF Film Thickness Measurement | Powerful X-ray Fluorescence Analyzers (helmut-fischer.com)