{"id":3366,"date":"2020-12-19T23:43:56","date_gmt":"2020-12-19T21:43:56","guid":{"rendered":"https:\/\/m-technologijos.lt\/produktai\/helmut-fischer-fisherscope-x-ray-xdl-and-xdlm-series\/"},"modified":"2023-10-16T11:15:03","modified_gmt":"2023-10-16T08:15:03","slug":"helmut-fischer-fisherscope-x-ray-xdl-and-xdlm-series","status":"publish","type":"products","link":"https:\/\/m-technologijos.lt\/en\/iranga\/coating-thickness-measurement\/x-ray-non-destructive-method\/helmut-fischer-fisherscope-x-ray-xdl-and-xdlm-series\/","title":{"rendered":"Helmut Fischer Fisherscope X-RAY XDL and XDLM Series"},"content":{"rendered":"<p>With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL\u00ae range enable automated serial tests. A variety of versions \u2013 differing in their X-ray source, filter, aperture and detector \u2013 make it possible to select the X-ray device with the configuration that best suits your specific measurement task.<\/p>\n<p>&nbsp;<\/p>\n<h2>Features<\/h2>\n<ul>\n<li>X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components<\/li>\n<li>Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)<\/li>\n<li>Automated serial testing with programmable XY-table and Z-axis (optional)<\/li>\n<li>Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Applications<\/h2>\n<h4>Coating Thickness Measurement<\/h4>\n<ul>\n<li>Measurement of coatings on large boards and flexible circuit boards (flex PCBs)<\/li>\n<li>Thin conductive and\/or separating layers on circuit boards<\/li>\n<li>Coatings on three-dimensional components<\/li>\n<li>Chrome coatings, for example plastic items with decorative chrome finish<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h4>Material Analysis<\/h4>\n<ul>\n<li>Analysis of electroplating baths<\/li>\n<li>Analysis of functional coatings in the electronics and semiconductor industry<\/li>\n<li>Analysis of hard material coatings, for example CrN, TiN or TiCN<\/li>\n<\/ul>\n<p>For more information <a href=\"https:\/\/www.helmut-fischer.com\/products\/fischerscope-x-ray-xdl-and-xdlm\" target=\"_blank\" rel=\"noopener\">Helmut Fischer website.<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>With motor-driven axes (optional) and measurement direction from top to&hellip;<\/p>\n","protected":false},"featured_media":2634,"template":"","meta":{"mt_image_url":"","footnotes":""},"categories":[103,97],"class_list":["post-3366","products","type-products","status-publish","has-post-thumbnail","hentry","category-material-analysis","category-x-ray-non-destructive-method"],"_links":{"self":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/3366","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/types\/products"}],"version-history":[{"count":1,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/3366\/revisions"}],"predecessor-version":[{"id":3367,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/3366\/revisions\/3367"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media\/2634"}],"wp:attachment":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media?parent=3366"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/categories?post=3366"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}