{"id":195046,"date":"2026-10-12T12:00:00","date_gmt":"2026-10-12T12:00:00","guid":{"rendered":"https:\/\/m-technologijos.lt\/?post_type=products&#038;p=195046"},"modified":"2026-10-12T18:09:58","modified_gmt":"2026-10-12T15:09:58","slug":"helmut-fischer-fisiq-x-xrf-software-ai","status":"publish","type":"products","link":"https:\/\/m-technologijos.lt\/en\/equipment\/metal-gold-analysis-xrf\/xrf-software-standards\/helmut-fischer-fisiq-x-xrf-software-ai\/","title":{"rendered":"Helmut Fischer FISIQ X \u2013 XRF software with AI"},"content":{"rendered":"<h2>Applications<\/h2>\n<p>For users of the new-generation FISCHERSCOPE XDAL and XDV instruments. The software is designed for coating thickness measurement and material analysis; it simplifies the workflow and increases throughput.<\/p>\n<h2>Key features<\/h2>\n<ul>\n<li>AI-assisted spectrum mode for analysing and comparing spectra; fast composition analysis of unknown materials<\/li>\n<li>Four guided workflows: calibration, measurement, analysis, reports<\/li>\n<li>Traceability through calibration standards with DAkkS certificate and a standards library<\/li>\n<li>Up to 6 times faster coating thickness calculation and up to 13 times faster material analysis than WinFTM 6<\/li>\n<li>Improved algorithm engine \u2013 stability and repeatability<\/li>\n<\/ul>\n<h2>Technical data<\/h2>\n<ul>\n<li>Supported instruments: FISCHERSCOPE XDAL, FISCHERSCOPE XDV<\/li>\n<li>Calculation speed: up to 6\u00d7 (coatings) \/ up to 13\u00d7 (material analysis) compared with WinFTM 6<\/li>\n<\/ul>\n<h2>Standards<\/h2>\n<p>calibration standards with DAkkS certificate<\/p>\n<h2>What we offer<\/h2>\n<ul>\n<li>Selection of the instrument and configuration for your task, together with the manufacturer<\/li>\n<li>Trial measurements of your samples in the manufacturer&#8217;s laboratory<\/li>\n<li>Training, calibration and service organised through the manufacturer<\/li>\n<\/ul>\n<p><a class=\"fl-button mt-cta\" href=\"\/en\/contacts\/\">Request a quote<\/a><\/p>\n<p class=\"mt-source\"><small>Technical data according to the manufacturer: <a href=\"https:\/\/www.helmut-fischer.com\/products\/xrf-instruments\/fisiq-x\" rel=\"nofollow noopener\" target=\"_blank\">helmut-fischer.com<\/a><\/small><\/p>\n","protected":false},"excerpt":{"rendered":"<p>For users of the new-generation FISCHERSCOPE XDAL and XDV instruments.<\/p>\n","protected":false},"featured_media":95047,"template":"","meta":{"mt_image_url":"https:\/\/www.helmut-fischer.com\/fileadmin\/_processed_\/3\/f\/csm_fisiq-x-software-spectrum-mode_1541bab8fd.png","footnotes":""},"categories":[242],"class_list":["post-195046","products","type-products","status-publish","has-post-thumbnail","hentry","category-xrf-software-standards"],"_links":{"self":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195046","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/types\/products"}],"version-history":[{"count":2,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195046\/revisions"}],"predecessor-version":[{"id":198443,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195046\/revisions\/198443"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media\/95047"}],"wp:attachment":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media?parent=195046"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/categories?post=195046"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}