{"id":195038,"date":"2026-10-12T12:00:00","date_gmt":"2026-10-12T12:00:00","guid":{"rendered":"https:\/\/m-technologijos.lt\/?post_type=products&#038;p=195038"},"modified":"2026-10-12T18:10:00","modified_gmt":"2026-10-12T15:10:00","slug":"helmut-fischer-x-ray-xdv-u-semi-wafer-inspection","status":"publish","type":"products","link":"https:\/\/m-technologijos.lt\/en\/equipment\/metal-gold-analysis-xrf\/xrf-microstructures-pcb\/helmut-fischer-x-ray-xdv-u-semi-wafer-inspection\/","title":{"rendered":"Helmut Fischer FISCHERSCOPE X-RAY XDV-\u00b5 SEMI \u2013 automated wafer microstructure inspection"},"content":{"rendered":"<h2>Applications<\/h2>\n<p>For semiconductor manufacturing and packaging (2.5D\/3D) \u2013 inspection of nanometre-scale under-bump metallisation (UBM), C4 and smaller solder bumps, and lead-free solder caps on copper pillars. The enclosed measuring environment ensures constant conditions; the instrument is suitable for cleanrooms and 24\/7 operation.<\/p>\n<h2>Key features<\/h2>\n<ul>\n<li>Fully automated wafer loading from FOUPs and cassettes; compatible with OHT and AGV supply<\/li>\n<li>Integrated CCTV monitoring, large service hatches<\/li>\n<li>Polycapillary optics with 10 or 20 \u00b5m FWHM measuring spots<\/li>\n<li>DPP+ \u2013 up to 50 % higher performance<\/li>\n<li>Programmable measurements based on pattern recognition<\/li>\n<li>Standardised SECS\/GEM communication<\/li>\n<\/ul>\n<h2>Models<\/h2>\n<p>detector (20 \/ 50 mm\u00b2) and spot (10 \/ 20 \u00b5m) options<\/p>\n<h2>Technical data<\/h2>\n<ul>\n<li>Wafers: 6, 8 and 12 in.\u00a0(up to 12 in.)<\/li>\n<li>X-ray tube: &#8220;Ultra&#8221; microfocus, tungsten anode<\/li>\n<li>Detector: SDD 20 or 50 mm\u00b2, Peltier cooling<\/li>\n<li>Measuring spot: 10 or 20 \u00b5m (FWHM)<\/li>\n<li>Filters: 4 interchangeable<\/li>\n<li>Stage: programmable, with vacuum wafer chuck<\/li>\n<li>Communication: SECS\/GEM<\/li>\n<li>Software: WinFTM<\/li>\n<\/ul>\n<h2>What we offer<\/h2>\n<ul>\n<li>Selection of the instrument and configuration for your task, together with the manufacturer<\/li>\n<li>Trial measurements of your samples in the manufacturer&#8217;s laboratory<\/li>\n<li>Training, calibration and service organised through the manufacturer<\/li>\n<\/ul>\n<p><a class=\"fl-button mt-cta\" href=\"\/en\/contacts\/\">Request a quote<\/a><\/p>\n<p class=\"mt-source\"><small>Technical data according to the manufacturer: <a href=\"https:\/\/www.helmut-fischer.com\/products\/automation-solutions\/fischerscope-x-ray-xdv-mue-semi\" rel=\"nofollow noopener\" target=\"_blank\">helmut-fischer.com<\/a><\/small><\/p>\n","protected":false},"excerpt":{"rendered":"<p>For semiconductor manufacturing and packaging (2.5D\/3D) \u2013 inspection of nanometre-scale under-bump metallisation (UBM), C4 and smaller solder bumps, and lead-free solder caps on copper pillars.<\/p>\n","protected":false},"featured_media":95039,"template":"","meta":{"mt_image_url":"https:\/\/www.helmut-fischer.com\/fileadmin\/_processed_\/1\/1\/csm_0_0_0f55529c26.png","footnotes":""},"categories":[241],"class_list":["post-195038","products","type-products","status-publish","has-post-thumbnail","hentry","category-xrf-microstructures-pcb"],"_links":{"self":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195038","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/types\/products"}],"version-history":[{"count":2,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195038\/revisions"}],"predecessor-version":[{"id":198453,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195038\/revisions\/198453"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media\/95039"}],"wp:attachment":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media?parent=195038"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/categories?post=195038"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}