{"id":195030,"date":"2026-10-12T12:00:00","date_gmt":"2026-10-12T12:00:00","guid":{"rendered":"https:\/\/m-technologijos.lt\/?post_type=products&#038;p=195030"},"modified":"2026-10-12T18:10:01","modified_gmt":"2026-10-12T15:10:01","slug":"helmut-fischer-fischerscope-xdal-thin-coating-analyzer","status":"publish","type":"products","link":"https:\/\/m-technologijos.lt\/en\/equipment\/metal-gold-analysis-xrf\/benchtop-xrf-spectrometers\/helmut-fischer-fischerscope-xdal-thin-coating-analyzer\/","title":{"rendered":"Helmut Fischer FISCHERSCOPE XDAL \u2013 new-generation thin coating analyzer"},"content":{"rendered":"<h2>Applications<\/h2>\n<p>For electronics and semiconductor manufacturing (lead frames, connectors, PCBs), for inspecting multilayer systems and functional coatings \u2264 0.1 \u00b5m, and for determining the lead content in solders and the phosphorus content in NiP coatings. The manufacturer presents it as the successor to the FISCHERSCOPE X-RAY XDAL.<\/p>\n<h2>Key features<\/h2>\n<ul>\n<li>FISIQ X software with AI-assisted spectrum mode<\/li>\n<li>High-speed Z axis \u2013 6 times faster positioning, autofocus &lt; 2 s (14 times faster than the X-RAY XDAL 237)<\/li>\n<li>Overview camera with 10 times higher resolution, multi-zone LED illumination<\/li>\n<li>Motorised hood (automatic or manual mode), programmable measuring stage<\/li>\n<li>180\u00b0 status indicator; individually approved fully protected instrument<\/li>\n<li>Optimised arrangement of tube, sample and detector \u2013 higher intensity<\/li>\n<\/ul>\n<h2>Models<\/h2>\n<p>XDAL 620 (SDD 20 mm\u00b2); XDAL 650 (SDD 50 mm\u00b2). Previous generation: X-RAY XDAL 237 (Si-PIN or SDD 20\/50 mm\u00b2, spot approx. \u00d8 0.15 mm, 4 apertures, 3 filters, up to 140 mm, WinFTM); X-RAY XDAL 600 (SDD 20 mm\u00b2, manual scissor stage, DPP+)<\/p>\n<h2>Technical data<\/h2>\n<ul>\n<li>X-ray tube: microfocus, tungsten anode (other anodes on request)<\/li>\n<li>Detector: SDD 20 mm\u00b2 or 50 mm\u00b2<\/li>\n<li>Apertures \/ filters: 4 interchangeable \/ 6 interchangeable<\/li>\n<li>Sample height: up to 140 mm<\/li>\n<li>Measuring direction: from above, stepless distance<\/li>\n<li>Coating thickness: &lt; 0.05 \u00b5m; analysis at ppm level<\/li>\n<li>Software: FISIQ X<\/li>\n<\/ul>\n<h2>What we offer<\/h2>\n<ul>\n<li>Selection of the instrument and configuration for your task, together with the manufacturer<\/li>\n<li>Trial measurements of your samples in the manufacturer&#8217;s laboratory<\/li>\n<li>Training, calibration and service organised through the manufacturer<\/li>\n<\/ul>\n<p><a class=\"fl-button mt-cta\" href=\"\/en\/contacts\/\">Request a quote<\/a><\/p>\n<p class=\"mt-source\"><small>Technical data according to the manufacturer: <a href=\"https:\/\/www.helmut-fischer.com\/products\/xrf-instruments\/fischerscope-xdal\" rel=\"nofollow noopener\" target=\"_blank\">helmut-fischer.com<\/a>, <a href=\"https:\/\/www.helmut-fischer.com\/products\/xrf-instruments\/fischerscope-x-ray-xdal\" rel=\"nofollow noopener\" target=\"_blank\">helmut-fischer.com<\/a><\/small><\/p>\n","protected":false},"excerpt":{"rendered":"<p>For electronics and semiconductor manufacturing (lead frames, connectors, PCBs), for inspecting multilayer systems and functional coatings \u2264 0.1 \u00b5m, and for determining the lead content in solders and the phosphorus content in NiP coatings.<\/p>\n","protected":false},"featured_media":95031,"template":"","meta":{"mt_image_url":"https:\/\/www.helmut-fischer.com\/fileadmin\/_processed_\/7\/5\/csm_0_0_d7c462bfc8.png","footnotes":""},"categories":[235],"class_list":["post-195030","products","type-products","status-publish","has-post-thumbnail","hentry","category-benchtop-xrf-spectrometers"],"_links":{"self":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195030","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products"}],"about":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/types\/products"}],"version-history":[{"count":2,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195030\/revisions"}],"predecessor-version":[{"id":198460,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/products\/195030\/revisions\/198460"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media\/95031"}],"wp:attachment":[{"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/media?parent=195030"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/m-technologijos.lt\/en\/wp-json\/wp\/v2\/categories?post=195030"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}